The group of electrochemical nanostructuring
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Moscow State University
Leninskie Gory 1, bld. 3,
119991 Moscow, Russia
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      Statistical analysis of images
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      Chemistry Department,
      Moscow State University
      Leninskie Gory 1, bld. 3,
      119991 Moscow, Russia
      kirill@inorg.chem.msu.ru

      Statistical analysis of images

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      • Statistical analysis of images

      The starting point for statistical analysis of SEM images of porous films is the obtaining pore-size distributions as well as distributions of distances between adjacent pores. The width of these distributions can serve as a measure of the structural ordering along with other parameters of ordering.

      ImageJ is a convenient and multifunctional software for processing electron microscopy images. In particular, by analysis of SEM micrographs of the top or bottom surface of anodic alumina with this software, one can determine porosity, pore-size distribution, and also find the coordinates of the centers of mass of each pore (see Fig. 1a, b).

      Distances between adjacent pores are calculated according to the Delaunay triangulation algorithm using Statistics2D software (developer: Dmitry S. Koshkodaev). The input data are the coordinates of the centers of mass of each pore in the analyzed image.

      Figure1.1.jpg

      Figure 1. (a) SEM image of the top surface of an anodic alumina porous film prepared by two-step anodizing of aluminium in 0.3 M H2C2O4 at 40 V. Dp is the pore diameter, Dint is the distance between the pores. (b) Pore-size distribution based on statistical processing of SEM micrographs using the ImageJ software. (c) The distribution of the distances between pores, plotted using the Delaunay triangulation algorithm with Statistics2D software. The illustrations are adopted from [A.P. Leontiev et al. // Electrochim. Acta, 2015, v. 155, pp. 466–473].

      Statistics2D software and instruction on its application for calculating the distances between adjacent pores can be downloaded free of charge following the link below.

      DOWNLOAD

      If you used Statistics2D and found it useful, please cite our work [I.V. Roslyakov, D.S. Koshkodaev, A.A. Eliseev, D. Hermida-Merino, V.K. Ivanov, A.V. Petukhov, K.S. Napolskii. Growth of Porous Anodic Alumina on Low-Index Surfaces of Al Single Crystals // The Journal of Physical Chemistry C, 2017, v. 121, pp. 27511–27520. DOI: 10.1021/acs.jpcc.7b09998] in your scientific papers.

          



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      +7 (916) 232-38-29
      kirill@inorg.chem.msu.ru
      Chemistry Department,
      Moscow State University
      Leninskie Gory 1, bld. 3,
      119991 Moscow, Russia